70-GHz relaxation oscillation in a vertical cavity surface emitting laser

Author

Tauber, D. ; Wang, Guibin ; Geels, R.S. ; Bowers, John E. ; Coldren, Larry A.

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA

Volume

39

Issue

11

fYear

1992

fDate

11/1/1992 12:00:00 AM

Firstpage

2652

Abstract

Summary form only given. Very-high-frequency relaxation oscillations were measured in an electrically pumped vertical cavity surface emitting laser (VCSEL). The measurements were performed over a range of drive currents, and a 71-GHz relaxation oscillation was observed when current injection was maximum. The lasers used for the measurements consisted of an active region of 3 In_0.2Ga_0.8As quantum wells. CW (continuous-wave) measurements showed a very high resonance frequency-square root of power coefficient of 7 GHz/√mW. The maximum resonance frequency was limited to 7 GHz by heating. The larger signal pulse responses also showed a linear dependence of relaxation oscillation frequency on square root of current above threshold, with a maximum of 71 GHz for a peak drive voltage on the order of 15 V

Keywords

III-V semiconductors; gallium arsenide; indium compounds; oscillations; semiconductor lasers; 71 GHz; CW measurements; In_0.2Ga_0.8As quantum wells; VCSEL; current injection; drive currents; electrical pumping; maximum resonance frequency; relaxation oscillations; signal pulse responses; vertical cavity surface emitting laser; Current measurement; Electric variables measurement; Laser excitation; Performance evaluation; Pump lasers; Quantum well lasers; Resonance; Resonant frequency; Surface emitting lasers; Vertical cavity surface emitting lasers;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.163510

Filename

163510