DocumentCode :
947915
Title :
Compressively strained 1.3 μm InAsP/InP and GaInAsP/InP multiple quantum well lasers for high-speed parallel data transmission systems
Author :
Fukushima, Tom ; Kasukawa, Akihiko ; Iwase, Masayuki ; Namegaya, Takeshi ; Shibata, Mitsuyoshi
Author_Institution :
Furukawa Electric Co. Ltd., Yokohama, Japan
Volume :
29
Issue :
6
fYear :
1993
fDate :
6/1/1993 12:00:00 AM
Firstpage :
1536
Lastpage :
1543
Abstract :
Turn-on delay times in the pulse response of compressively strained InAsP/InP double-quantum-well (DOW) lasers and GaInAsP/InP multiple-quantum-well (MQW) lasers emitting at 1.3 μm were investigated. DQW lasers with 200-μm cavity length and high-reflection coating achieved both a very low threshold current (1.8 mA) and a small turn-on delay time (200 ps), even under a biasless 30-mA pulse current. Compressively strained or lattice-matched GaInAsP MQW lasers and GaInAsP double-heterostructure (DH) lasers were also fabricated and compared. It was observed that the carrier lifetime was enhanced for InAsP DQW lasers and strained GaInAsP MQW lasers compared to the lattice-matched GaInAsP MQW lasers and conventional double-heterostructure lasers. To explain this increase in the carrier lifetime, the effect of the carrier transport on the carrier lifetime was studied. The additional power penalty due to the laser turn-on delay was simulated and is discussed
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; optical communication equipment; semiconductor lasers; 1.3 micron; 1.8 mA; 200 micron; 200 ps; 30 mA; DOW; GaInAsP-InP; IR; InAsP-InP; MQW; OC equipment; carrier lifetime; carrier transport; cavity length; compressively strained; computer networks; double-heterostructure; double-quantum-well; high-reflection coating; high-speed parallel data transmission systems; laser turn-on delay; lattice-matched; low threshold current; multiple quantum well lasers; optical communications equipment; power penalty; pulse current; pulse response; turn-on delay times; Charge carrier lifetime; Coatings; DH-HEMTs; Delay effects; Indium phosphide; Optical pulses; Power lasers; Pulse compression methods; Quantum well devices; Threshold current;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.234388
Filename :
234388
Link To Document :
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