Title :
Single-ended infrared photothermal radiometric measurement of quantum efficiency and metastable lifetime in solid-state laser materials: The case of ruby (Cr3+:Al2O3)
Author :
Mandelis, Andreas ; Munidasa, Mahendra ; Othonos, Andreas
Author_Institution :
Dept. of Mech. Eng., Toronto Univ., Ont., Canada
fDate :
6/1/1993 12:00:00 AM
Abstract :
A simple, self-consistent frequency-scanned photothermal radiometric (PTR) detection scheme was applied to the measurement of the metastable state de-excitation parameters of a ruby laser rod. The radiative quantum efficiency and lifetime in this material were calculated from the extrema of the photothermal phase and the amplitude slope versus the excitation laser beam modulation frequency curves, without recourse to the conventional second measurement to eliminate effects of photothermal saturation. This technique simplifies significantly the experimental methodology, guarantees uniqueness of the measured quantities, and increases the measurement range of lifetimes as compared to other photothermal-based methods. Therefore, it may prove valuable for fast industrial quality control, as well as for fundamental studies of laser materials
Keywords :
chromium; laser variables measurement; optical materials; optical modulation; optical testing; photothermal effects; quality control; radiometry; ruby; solid lasers; Al2O3:Cr3+; IR; amplitude slope; excitation laser beam modulation frequency curves; fast industrial quality control; frequency-scanned; infrared photothermal radiometric measurement; laser materials; laser rod; measurement range; metastable lifetime; metastable state de-excitation parameters; photothermal phase; photothermal-based methods; quantum efficiency; radiative lifetime; radiative quantum efficiency; ruby; self-consistent; solid-state laser materials; Amplitude modulation; Frequency measurement; Frequency modulation; Laser beams; Laser excitation; Metastasis; Optical materials; Optical modulation; Phase modulation; Radiometry;
Journal_Title :
Quantum Electronics, IEEE Journal of