• DocumentCode
    948011
  • Title

    An educational perspective on in-circuit testing

  • Author

    Beaujean, D.A. ; Morgan, S.B.

  • Author_Institution
    Polytechnic of Wales, Department of Electrical & Electronic Engineering, Pontypridd, UK
  • Volume
    135
  • Issue
    4
  • fYear
    1988
  • fDate
    4/1/1988 12:00:00 AM
  • Firstpage
    233
  • Lastpage
    240
  • Abstract
    The increasing use of CADMAT tools in the production environment presents a major challenge in personnel training. Electronics manufacturers introducing ATE are quickly made aware of the scarcity of test engineers experienced in using this equipment and of the need for rapid training to increase the pool of available talent. The paper gives consideration to the ways in which ATE training might be implemented and an outline scheme is described for a currently operating three-day course on in-circuit testing.
  • Keywords
    automatic test equipment; educational courses; integrated circuit testing; printed circuit testing; training; ATE; CADMAT tools; IC testing; education; in-circuit testing; personnel training; three-day course;
  • fLanguage
    English
  • Journal_Title
    Physical Science, Measurement and Instrumentation, Management and Education - Reviews, IEE Proceedings A
  • Publisher
    iet
  • ISSN
    0143-702X
  • Type

    jour

  • DOI
    10.1049/ip-a-1.1988.0037
  • Filename
    4648525