DocumentCode
948038
Title
AlSb-InAs-AlSb p-n-p transistors with low turn-on voltage, narrow bases, and low base resistance
Author
Pekarik, John J. ; Kroemer, H. ; English, J.H.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA
Volume
39
Issue
11
fYear
1992
fDate
11/1/1992 12:00:00 AM
Firstpage
2659
Lastpage
2660
Abstract
Summary form only given. The authors built and characterized transistors with base widths from 100 nm to as thin as 25 nm. The transistors were grown on GaAs substrates and fabricated into emitter-up double-mesa structures. Driving equivalent current densities requires an emitter-base voltage more than 1 V below that needed in graded-junction GaAs HBTs (heterojunction bipolar transistors) or a half volt less than Si bipolars. These devices supplied finite current gain for emitter-base voltages above 300 mV. The gain was current-dependent, peaking at about β=25 for the narrowest bases, and appeared to be limited by recombination at the emitter-base interface. The transistors supported a collector-to-emitter voltage of V CE>2.5 V. Intrinsic base resistances were extremely low
Keywords
III-V semiconductors; aluminium compounds; heterojunction bipolar transistors; indium compounds; 25 to 100 nm; AlSb-InAs-AlSb; GaAs substrates; collector-to-emitter voltage; current gain; emitter-base voltage; emitter-up double-mesa structures; low base resistance; low turn-on voltage; narrow bases; p-n-p transistors; Diodes; Doping; Electrons; Gold; Indium gallium arsenide; Indium phosphide; Low voltage; Molecular beam epitaxial growth; Scattering; Temperature distribution;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.163523
Filename
163523
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