• DocumentCode
    948065
  • Title

    Low-threshold tensile-strained InGaAs-InGaAsP quantum-well lasers with single-step separate-confinement heterostructures

  • Author

    Yamamoto, Tsuyoshi ; Nobuhara, Hiroyuki ; Tanaka, Kazuhiro ; Odagawa, Tetsufumi ; Sugawara, Mitsuru ; Fujii, Takuya ; Wakao, Kiyohide

  • Author_Institution
    Fujitsu Lab. Ltd., Atsugi, Japan
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    6/1/1993 12:00:00 AM
  • Firstpage
    1560
  • Lastpage
    1564
  • Abstract
    The authors studied tensile-strained InGaAs-InGaAsP quantum-well lasers with single-step separate-confinement heterostructures (SCH). They obtained threshold currents below 2 mA at 20°C and below 10 mA at 100°C with indium mole fractions of 0.3 and 0.35 in the active layers. They found that the poorer carrier confinement of the longer wavelength SCH layer lowered the characteristic temperature at high temperatures. A laser with two In0.35Ga0.65As wells and a 1.1-μm composition InGaAsP SCH layer produced a 1.6-mA CW threshold current at 20°C and lasing at 120°C. Using this laser, very short lasing delays under zero-bias current over a wide temperature range and 2 Gb/s modulation under zero-bias current at 70°C were achieved
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; optical modulation; semiconductor lasers; 1.1 micron; 1.6 mA; 10 mA; 100 degC; 120 degC; 2 mA; 20 degC; 70 degC; CW threshold current; In mole fractions; InGaAs-InGaAsP; SCH; active layers; carrier confinement; characteristic temperature; high temperatures; low threshold laser diodes; quantum-well lasers; short lasing delays; single-step separate-confinement heterostructures; tensile-strained; wide temperature range; zero-bias current; Carrier confinement; Delay; High speed optical techniques; Indium phosphide; Photonic band gap; Quantum well lasers; Semiconductor lasers; Temperature dependence; Temperature distribution; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.234406
  • Filename
    234406