• DocumentCode
    948068
  • Title

    Modulation characteristics of InP-based MQW lasers: the impact of biaxial compressive and tensile strain

  • Author

    Nichols, David ; Davis, Lisa ; Lam, Y. ; Espinosa, Eduardo ; Singh, Jaskirat ; Bhattacharya, Pallab

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI
  • Volume
    39
  • Issue
    11
  • fYear
    1992
  • fDate
    11/1/1992 12:00:00 AM
  • Firstpage
    2661
  • Lastpage
    2662
  • Abstract
    Summary form only given. The authors relate observed modulation characteristics of strained InxGa1-xAs-InP (0.33⩽x⩽0.73) MQW (multi-quantum-well) separate-confinement-heterostructure (SCH) lasers to properties of the band structures of biaxially strained InxGa1-xAs quantum wells. The differential gain was found to increase significantly for both compressive and tensile strain with respect to its lattice-matched value, indicating that strained devices will have larger 3-dB bandwidths than their lattice-matched counterparts. The authors have also measured the microwave responses of both strained and lattice-matched devices and found that the bandwidth of the lattice-matched devices are 3 and 5 GHz for devices with 63% In in the quantum wells. In addition, by measuring the turn-on delay time at various levels of drive current, the authors have measured a spontaneous lifetime of 0.78 ns for compressively strained ridge waveguide devices. They also calculated Auger coefficients for devices with 73% In in the wells
  • Keywords
    III-V semiconductors; deformation; gallium arsenide; indium compounds; optical modulation; optical waveguides; semiconductor lasers; 3 GHz; 5 GHz; Auger coefficients; InxGa1-xAs-InP; InP based SCH lasers; MQW lasers; band structures; bandwidth; biaxial compressive strain; differential gain; microwave responses; modulation characteristics; ridge waveguide devices; semiconductor lasers; separate-confinement-heterostructure; strained multiquantum wells; tensile strain; Bandwidth; Current measurement; Delay effects; Microwave devices; Microwave measurements; Propagation delay; Quantum well devices; Quantum well lasers; Tensile strain; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.163526
  • Filename
    163526