Title :
Selection of Reliability Levels in Equipment Design
Author :
Garbarino, Harold L.
Author_Institution :
Elec. Eng. Dept., Armour Research Foundations, Illinois Inst. of Tech., Chicago, Ill.
fDate :
4/1/1958 12:00:00 AM
Keywords :
Analog computers; Control systems; Ducts; Electronic equipment; Feedback loop; Industrial electronics; Open loop systems; Stability; Temperature control; Temperature dependence;
Journal_Title :
Industrial Electronics, IRE Transactions on
DOI :
10.1109/IRE-IE.1958.5007809