Rapid Volumetric Particle Size Analysis Via Electronics

A basically new method for sub-sieve particle size analysis is described, with emphasis on the three dimensional nature of the measurement principle. Previous methods are comparatively reviewed, and the role played by electronics in enabling speed and accuracy of the new method is discussed. By suspending particles in a conductive liquid and causing the suspension to flow through an immersed aperture with electrodes on either side, a series of voltage pulses is produced by the passages of individual particles. This series of pulses is electronically scaled and counted. Various aspects of basic response, effects of coincident passages and calibration methods are discussed. Applications to a variety of materials are covered, with extension to different forms of data presentation for process control purposes. A number of specific example are included.