• DocumentCode
    948807
  • Title

    Real-time furnace modeling and diagnostics

  • Author

    Wang, Jiangxin ; Spanos, Costas J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    15
  • Issue
    4
  • fYear
    2002
  • fDate
    11/1/2002 12:00:00 AM
  • Firstpage
    393
  • Lastpage
    403
  • Abstract
    Precise control of process temperature has become increasingly important in today´s semiconductor industry. Multizone batch furnaces are used widely in current manufacturing lines, and high reliability of furnace systems is a crucial factor in achieving high product yield. However, uncertainty caused by sensor noise and failure may degrade reliability. In this work, the authors develop a methodology based on thermal modeling and sensor fusion techniques to detect temperature sensor failures, power supply failures, and system faults for the multizone furnace systems. The typical types of failures have been defined. The impact of single failures and different combinations of failures on the system behavior has been studied. The furnace system has been modeled based on both physical considerations and experimental data extraction. The fault detection methodology has been tested in simulations. Principal component analysis is utilized for choosing data types for different fault detection purposes. Sensor fusion is used to enhance reliability. Simulation results show that all different types of failures can be detected when data are rich enough. Experimental results show that all single failures and some of the failure combinations can be estimated when only steady-state and cooling-down data are utilized.
  • Keywords
    equivalent circuits; failure analysis; fault diagnosis; furnaces; integrated circuit manufacture; parameter estimation; principal component analysis; process control; real-time systems; reliability; semiconductor process modelling; sensor fusion; thermal analysis; PCA; cooling-down data; fault detection methodology; fault diagnostics methodology; model classification; model parameter estimation; multizone batch furnaces; power supply failures; principal component analysis; process temperature control; real-time furnace diagnostics; real-time furnace modeling; reliability enhancement; semiconductor manufacturing; sensor fusion techniques; steady-state data; system faults; temperature sensor failures; thermal modeling; Electronics industry; Fault detection; Furnaces; Power system modeling; Power system reliability; Process control; Semiconductor device manufacture; Sensor fusion; Temperature control; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2002.804874
  • Filename
    1134151