Title :
Industrial Measurements with X-Rays
Author_Institution :
General Electric Company, Milwaukee, Wis.
fDate :
5/1/1958 12:00:00 AM
Abstract :
A review is made of the application of x-ray photoelectric effect and scattering to diverse problems of measurement. The basis of operation of thickness and coating weight gages, spectrographic analyzers, diffraction apparatus, and inspection equipment will thereby be shown. It is recognised that many of the measurements now being made with x-rays could be made in no other way; thus, it is especially hoped that a useful solution may be suggested for yet unsolved problems.
Keywords :
Atomic measurements; Coatings; Electromagnetic scattering; Electromagnetic wave absorption; Electrons; Extraterrestrial measurements; Inspection; Particle scattering; X-ray diffraction; X-ray scattering;
Journal_Title :
Industrial Electronics, IRE Transactions on
DOI :
10.1109/IRE-IE.1958.5007836
