• DocumentCode
    948991
  • Title

    Long-term lifetests of c.w. (AlGa)As laser diodes at room temperature

  • Author

    Ettenberg, M. ; Kressel, H. ; Ladany, I.

  • Author_Institution
    RCA Laboratories, Princeton, USA
  • Volume
    14
  • Issue
    25
  • fYear
    1978
  • Firstpage
    815
  • Lastpage
    816
  • Abstract
    Real-time lifetest data are given for a group of c.w. laser diodes operated continuously for periods as long as 4 years. Out of 24 lasers studied, four lasers have failed to date. This failure rate is compared with accelerated lifetests at 70°C; an estimated m.t.t.f. of ¿ 105 hours at room temperature is obtained.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; reliability; semiconductor device testing; semiconductor junction lasers; AlGaAs; continuous wave laser diodes; failure rate; lifetest data; reliability; semiconductor junction lasers;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19780550
  • Filename
    4242947
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=948991