Title :
Semisupervised Learning for a Hybrid Generative/Discriminative Classifier based on the Maximum Entropy Principle
Author :
Fujino, Akinori ; Ueda, Naonori ; Saito, Kazumi
Author_Institution :
NTT Corp., Kyoto
fDate :
3/1/2008 12:00:00 AM
Abstract :
This paper presents a method for designing semisupervised classifiers trained on labeled and unlabeled samples. We focus on a probabilistic semisupervised classifier design for multiclass and single-labeled classification problems and propose a hybrid approach that takes advantage of generative and discriminative approaches. In our approach, we first consider a generative model trained by using labeled samples and introduce a bias correction model, where these models belong to the same model family but have different parameters. Then, we construct a hybrid classifier by combining these models based on the maximum entropy principle. To enable us to apply our hybrid approach to text classification problems, we employed naive Bayes models as the generative and bias correction models. Our experimental results for four text data sets confirmed that the generalization ability of our hybrid classifier was much improved by using a large number of unlabeled samples for training when there were too few labeled samples to obtain good performance. We also confirmed that our hybrid approach significantly outperformed the generative and discriminative approaches when the performance of the generative and discriminative approaches was comparable. Moreover, we examined the performance of our hybrid classifier when the labeled and unlabeled data distributions were different.
Keywords :
Bayes methods; learning (artificial intelligence); maximum entropy methods; pattern classification; probability; bias correction model; hybrid generative-discriminative classifier; maximum entropy principle; naive Bayes models; probabilistic semisupervised classifier; semisupervised learning; text classification; bias correction; generative model; maximum entropy principle; text classification; unlabeled samples; Algorithms; Artificial Intelligence; Computer Simulation; Discriminant Analysis; Entropy; Information Storage and Retrieval; Models, Statistical; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2007.70710