Title :
Quantising error in a Dolph-Cheby¿shev data-window multiplier circuit
Author :
Trivedi, M. ; Lever, K.V.
Author_Institution :
Chelsea College, Department of Electronics, London, UK
Abstract :
In the letter we present experimental confirmation of a theoretical model used to characterise the degradation of the peak/sidelobe level ratio by pre- and postmultiplication quantisation errors in a digital data-window circuit.
Keywords :
digital circuits; errors; multiplying circuits; Dolph Chebyshev data window multiplier circuit; digital data window circuit; experimental confirmation; peak/sidelobe level ratio degradation; postmultiplication quantisation errors; premultiplication quantisation errors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790099
