Radiation hardness perspectives for the design of analog detector readout circuits in the 0.18-μm CMOS generation

Author

Manghisoni, Massimo ; Ratti, Lodovico ; Re, Valerio ; Speziali, Valeria

Author_Institution

Dipt. di Ingegneria, Universita di Bergamo, Dalmine, Italy

Volume

49

Issue

6

fYear

2002

fDate

12/1/2002 12:00:00 AM

Firstpage

2902

Lastpage

2909

Abstract

This paper presents a study of the ionizing radiation tolerance of analog parameters of 0.18-μm CMOS transistors, in view of the application to the design of front-end integrated circuits for detectors in high-energy physics experiments. Static, signal, and noise performances of devices with various gate dimensions were monitored before and after irradiation up to a 300-kGy(Si) total dose of ⁶⁰Co γ-rays. Different device biasing conditions under irradiation were used, and the relevant results are discussed. A comparison with previous CMOS generations is carried out to evaluate the impact of device scaling on the radiation sensitivity.

Keywords

1/f noise; CMOS analogue integrated circuits; MOSFET; gamma-ray effects; integrated circuit design; nuclear electronics; radiation hardening (electronics); readout electronics; semiconductor device noise; white noise; 0.18 micron; 0.18-μm CMOS generation; 1/f noise; 300 kGy; CMOS analog detector readout circuit design; MOSFET noise components; analog parameters; device biasing conditions; front-end integrated circuits; gamma-ray irradiation; gate dimensions; high-energy physics experiments; ionizing radiation tolerance; noise performance; radiation hardness perspectives; radiation sensitivity; signal performance; static performance; white noise; Application specific integrated circuits; CMOS analog integrated circuits; CMOS integrated circuits; CMOS process; CMOS technology; Ionizing radiation; MOSFETs; Physics; Radiation detector circuits; Radiation detectors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.805413

Filename

1134238