• DocumentCode
    949744
  • Title

    Radiation hardness qualification of InGaAsP/InP 1310 nm lasers for the CMS Tracker optical links

  • Author

    Gill, Karl ; Grabit, Robert ; Troska, Jan ; Vasey, Francois

  • Author_Institution
    EP Div., CERN, Geneva, Switzerland
  • Volume
    49
  • Issue
    6
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    2923
  • Lastpage
    2929
  • Abstract
    The series of validation tests for radiation hardness qualification of lasers for use in 46000 optical links of the CMS Tracker detector at CERN, Geneva, Switzerland, are presented. These tests included accelerated radiation damage, annealing, and aging studies, simulating the effect of doses and fluences, up to 2×1014 particles/cm2 and 100 kGy, accumulated over a ten-year operating lifetime. The worst-case damage effect, in lasers operating closest to the beam-collision point, is expected to be a threshold current increase of under 6 mA. The lasers tested therefore qualify as being sufficiently radiation hard. The qualification tests also form the basis of future radiation hardness assurance of lasers during final production. An advance validation test of lasers from candidate wafers is defined that will confirm the radiation hardness of lasers before a large number of transmitters are assembled from these wafers.
  • Keywords
    III-V semiconductors; ageing; annealing; colliding beam accelerators; gallium arsenide; indium compounds; nuclear electronics; optical fibre communication; optical transmitters; radiation hardening (electronics); semiconductor lasers; 100 kGy; 1310 nm; CMS Tracker detector; InGaAsP-InP; InGaAsP/InP laser; advance validation test; aging; annealing; colliding beam accelerator; high energy physics experiment; optical link; optical transmitter; radiation damage; radiation hardness; threshold current; Accelerated aging; Collision mitigation; Indium phosphide; Life estimation; Life testing; Optical fiber communication; Qualifications; Radiation detectors; Simulated annealing; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2002.805422
  • Filename
    1134242