DocumentCode :
949744
Title :
Radiation hardness qualification of InGaAsP/InP 1310 nm lasers for the CMS Tracker optical links
Author :
Gill, Karl ; Grabit, Robert ; Troska, Jan ; Vasey, Francois
Author_Institution :
EP Div., CERN, Geneva, Switzerland
Volume :
49
Issue :
6
fYear :
2002
fDate :
12/1/2002 12:00:00 AM
Firstpage :
2923
Lastpage :
2929
Abstract :
The series of validation tests for radiation hardness qualification of lasers for use in 46000 optical links of the CMS Tracker detector at CERN, Geneva, Switzerland, are presented. These tests included accelerated radiation damage, annealing, and aging studies, simulating the effect of doses and fluences, up to 2×1014 particles/cm2 and 100 kGy, accumulated over a ten-year operating lifetime. The worst-case damage effect, in lasers operating closest to the beam-collision point, is expected to be a threshold current increase of under 6 mA. The lasers tested therefore qualify as being sufficiently radiation hard. The qualification tests also form the basis of future radiation hardness assurance of lasers during final production. An advance validation test of lasers from candidate wafers is defined that will confirm the radiation hardness of lasers before a large number of transmitters are assembled from these wafers.
Keywords :
III-V semiconductors; ageing; annealing; colliding beam accelerators; gallium arsenide; indium compounds; nuclear electronics; optical fibre communication; optical transmitters; radiation hardening (electronics); semiconductor lasers; 100 kGy; 1310 nm; CMS Tracker detector; InGaAsP-InP; InGaAsP/InP laser; advance validation test; aging; annealing; colliding beam accelerator; high energy physics experiment; optical link; optical transmitter; radiation damage; radiation hardness; threshold current; Accelerated aging; Collision mitigation; Indium phosphide; Life estimation; Life testing; Optical fiber communication; Qualifications; Radiation detectors; Simulated annealing; Threshold current;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2002.805422
Filename :
1134242
Link To Document :
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