Title :
Backside SEU laser testing for commercial off-the-shelf SRAMs
Author :
Darracq, F. ; Lapuyade, H. ; Buard, N. ; Mounsi, F. ; Foucher, B. ; Fouillat, P. ; Calvet, M.-C. ; Dufayel, R.
Author_Institution :
IXL, Bordeaux I Univ., Talence, France
fDate :
12/1/2002 12:00:00 AM
Abstract :
This paper presents a new methodology for single-event upset laser testing of commercial off-the-shelf SRAMs. This methodology is based on backside laser test and is illustrated with some experimental results obtained with a new dedicated laser test bench.
Keywords :
SRAM chips; integrated circuit testing; laser beam effects; measurement by laser beam; backside SEU laser testing; commercial off-the-shelf SRAM; Circuit testing; Costs; Laser theory; Linear particle accelerator; Optical pulses; Optical sensors; Pulsed laser deposition; Random access memory; Semiconductor lasers; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.805393
