DocumentCode :
949872
Title :
The effect of the proton-concentration-to-refractive-index models on the propagation properties of APE waveguides
Author :
Passaro, Angelo ; Franco, Marcos Antonio Ruggieri ; Abe, Nancy Mieko ; Sircilli, Francisco
Author_Institution :
Virtual Eng. Lab., CTA/IEAv, Brazil
Volume :
20
Issue :
8
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
1573
Lastpage :
1577
Abstract :
This work analyzes the effect of the proton-concentration-to-refractive-index relation on the computation of waveguiding properties of well-annealed proton-exchanged channel waveguides fabricated in a LiNbO3 substrate. Several such relations are presented in the literature. The application of these different relations in the numerical analysis results in a very different propagation behavior for the waveguide. For comparison purposes, an empirical relation that fits the published refractive-index-versus-proton-concentration experimental data for the α crystalline phase is also used.
Keywords :
annealing; finite element analysis; ion exchange; lithium compounds; optical waveguide theory; refractive index; α crystalline phase; LiNbO3; LiNbO3 APE waveguides; LiNbO3 substrate; anisotropic media; nonhomogeneous media; numerical analysis; propagation properties; proton diffusion process; proton-concentration-to-refractive-index models; refractive-index-versus-proton-concentration data; scalar finite-element method; waveguiding properties; well-annealed proton-exchanged channel waveguides; Crystallization; Lithium; Manufacturing processes; Optical devices; Optical propagation; Optical refraction; Optical variables control; Optical waveguides; Protons; Waveguide transitions;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2002.800264
Filename :
1058171
Link To Document :
بازگشت