Title :
Theoretical analysis of finite-height semiconductor-on-insulator-based planar photonic crystal waveguides
Author :
Søndergaard, Thomas ; Arentoft, Jesper ; Kristensen, Martin
Author_Institution :
COM, Tech. Univ. Denmark, Lyngby, Denmark
fDate :
8/1/2002 12:00:00 AM
Abstract :
A planar photonic crystal waveguide based on the semiconductor-on-insulator (SOI) materials system is analyzed theoretically. Two-dimensional (2-D) calculations and comparison with dispersion relations for the media above and below the finite-height waveguide are used to obtain design guidelines. Three-dimensional (3-D) calculations are given for the dispersion relations and field profiles. The field profiles obtained using 2-D and 3-D calculations are qualitatively similar. However, we find that compared with 2-D calculations, the frequencies of the guided modes are shifted and the number of guided modes changes. The theoretically predicted frequency intervals, where the waveguide supports leakage-free guidance of light, are compared with an experimental measurement for propagation losses. Two out of three frequency intervals coincide with low-measured propagation losses. The poor guidance of light for the third frequency interval is explained theoretically by investigating the vertical localization of the guided modes.
Keywords :
optical dispersion; optical losses; optical planar waveguides; optical waveguide theory; photonic crystals; silicon-on-insulator; dispersion relations; field profiles; finite-height SOI planar photonic crystal waveguides; frequency intervals; guided mode frequencies; leakage-free light guidance; planar photonic crystal waveguide; propagation losses; semiconductor-on-insulator materials system; three-dimensional calculations; two-dimensional calculations; vertical guided mode localization; Crystalline materials; Dispersion; Frequency; Photonic crystals; Planar waveguides; Propagation losses; Semiconductor materials; Semiconductor waveguides; Two dimensional displays; Waveguide theory;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2002.800380