Title :
Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis
Author :
Boulghassoul, Y. ; Massengill, L.W. ; Sternberg, Andrew L. ; Pease, Ronald L. ; Buchner, S. ; Howard, J.W. ; McMorrow, D. ; Savage, M.W. ; Poivey, C.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
fDate :
12/1/2002 12:00:00 AM
Abstract :
This work presents the development of a transistor-level circuit model of the LM124 operational amplifier specifically engineered and calibrated for analog single-event transient (ASET) computer simulations. The techniques presented rely heavily on datasheet specifications for electrical parameterization and experimental laser probing for dc and transient calibration. The resulting circuit model proves to be suitable for broad-beam SET predictions and fault diagnostics for space applications.
Keywords :
calibration; integrated circuit modelling; laser beam effects; operational amplifiers; LM124 operational amplifier; analog single-event transient analysis; computer simulation; electrical calibration; fault diagnostics; laser calibration; linear integrated circuit; parameter extraction; space electronics; transistor-level circuit model; Analog integrated circuits; Application software; Calibration; Circuit simulation; Circuit testing; Computer simulation; Laser modes; Operational amplifiers; Predictive models; Transient analysis;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.805400
