Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis

Author

Boulghassoul, Y. ; Massengill, L.W. ; Sternberg, Andrew L. ; Pease, Ronald L. ; Buchner, S. ; Howard, J.W. ; McMorrow, D. ; Savage, M.W. ; Poivey, C.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA

Volume

49

Issue

6

fYear

2002

fDate

12/1/2002 12:00:00 AM

Firstpage

3090

Lastpage

3096

Abstract

This work presents the development of a transistor-level circuit model of the LM124 operational amplifier specifically engineered and calibrated for analog single-event transient (ASET) computer simulations. The techniques presented rely heavily on datasheet specifications for electrical parameterization and experimental laser probing for dc and transient calibration. The resulting circuit model proves to be suitable for broad-beam SET predictions and fault diagnostics for space applications.

Keywords

calibration; integrated circuit modelling; laser beam effects; operational amplifiers; LM124 operational amplifier; analog single-event transient analysis; computer simulation; electrical calibration; fault diagnostics; laser calibration; linear integrated circuit; parameter extraction; space electronics; transistor-level circuit model; Analog integrated circuits; Application software; Calibration; Circuit simulation; Circuit testing; Computer simulation; Laser modes; Operational amplifiers; Predictive models; Transient analysis;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.805400

Filename

1134265