Title :
The role of parasitic elements in the single-event transient response of linear circuits
Author :
Sternberg, Andrew L. ; Massengill, L.W. ; Buchner, S. ; Pease, R.L. ; Boulghassoul, Y. ; Savage, M.W. ; McMorrow, D. ; Weller, R.A.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
fDate :
12/1/2002 12:00:00 AM
Abstract :
Parasitic elements can play an important role in the single-event transient sensitivity of a circuit. This work describes how parasitics can affect the simulation response of linear circuits and shows how parasitics have been identified using a pulsed laser.
Keywords :
analogue integrated circuits; laser beam effects; transient response; linear circuit simulation; parasitic element; pulsed laser irradiation; single-event transient response; Circuit simulation; Linear circuits; MOSFETs; Operational amplifiers; Optical pulses; Predictive models; Pulse amplifiers; Resistors; Semiconductor device modeling; Transient response;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.805340
