• DocumentCode
    950003
  • Title

    The role of parasitic elements in the single-event transient response of linear circuits

  • Author

    Sternberg, Andrew L. ; Massengill, L.W. ; Buchner, S. ; Pease, R.L. ; Boulghassoul, Y. ; Savage, M.W. ; McMorrow, D. ; Weller, R.A.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
  • Volume
    49
  • Issue
    6
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    3115
  • Lastpage
    3120
  • Abstract
    Parasitic elements can play an important role in the single-event transient sensitivity of a circuit. This work describes how parasitics can affect the simulation response of linear circuits and shows how parasitics have been identified using a pulsed laser.
  • Keywords
    analogue integrated circuits; laser beam effects; transient response; linear circuit simulation; parasitic element; pulsed laser irradiation; single-event transient response; Circuit simulation; Linear circuits; MOSFETs; Operational amplifiers; Optical pulses; Predictive models; Pulse amplifiers; Resistors; Semiconductor device modeling; Transient response;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2002.805340
  • Filename
    1134269
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=950003