Title :
Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators
Author :
LaLumondiere, Stephen D. ; Koga, Rocky ; Yu, Paul ; Maher, Michael C. ; Moss, Steven C.
Author_Institution :
Aerosp. Corp., Los Angeles, CA, USA
fDate :
12/1/2002 12:00:00 AM
Abstract :
We have measured the single-event transient (SET) response for a number of 139-type comparators with differing topologies. In this paper, we present the results from pulsed laser measurements on a number of different 139-type devices, as well as heavy ion measurements on a new RM139 device from NSC. Devices tested with the laser included the HS-139RH, PM139, LM139 and a more recent version of LM139 from NSC. We discuss the effects of different device topologies on SET sensitivity. Our results agree qualitatively with SPICE model calculations of LM139s by Johnston et al.
Keywords :
comparators (circuits); ion beam effects; laser beam effects; HS-139RH; LM139; PM139; RM139; analog integrated circuit; comparator device; heavy ion irradiation; pulsed laser irradiation; single-event transient response; Aerospace testing; Laser excitation; Laser modes; Logic devices; Metallization; Optical pulses; Pulse measurements; SPICE; Topology; Virtual manufacturing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.805414
