Title :
Evidence of collector-base junction burst noise
Author_Institution :
University of Salford, Department of Electrical Engineering, Salford, UK
Abstract :
Evidence has been found of collector-base (c.b.) junction burst noise. It is a much rarer phenomenon than emitter-base junction noise, having been found in only two samples from a batch of 100 noisy devices. Studies have been made of two devices from a 4-transistor array, one device exhibiting c.b. noise and the other e.b. noise.
Keywords :
bipolar transistors; electron device noise; random noise; bipolar transistors; collector base junction burst noise;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790139
