DocumentCode
950056
Title
Frequency domain analysis of analog single-event transients in linear circuits
Author
Boulghassoul, Y. ; Massengill, L.W. ; Turflinger, T.L. ; Holman, W.T.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Volume
49
Issue
6
fYear
2002
fDate
12/1/2002 12:00:00 AM
Firstpage
3142
Lastpage
3147
Abstract
Using frequency-domain analysis techniques, a study of the relationship between the frequency spectrum of a single-event transient (SET) stimulus and the frequency response of internal circuit blocks of typical operational amplifier architectures has been performed. Results explain several general analog SET (ASET) observations, including the relative importance of the stimulus temporal profile, the circuit bandwidth, and the ion strike location relative to major circuit modules. Benefits gained from frequency compensation are evident, as important filtering of high-frequency signal components occur, reducing detrimental effects on the operation of the circuit.
Keywords
SPICE; bipolar analogue integrated circuits; circuit simulation; fast Fourier transforms; frequency response; frequency-domain analysis; ion beam effects; operational amplifiers; transient analysis; LM124 operational amplifier; Silvaco SPICE circuit simulator; analog single-event transients; circuit bandwidth; fast Fourier transform; frequency compensation; frequency domain analysis; frequency response; frequency spectrum; high-frequency signal component filtering; ion strike location; linear circuits; operational amplifier architectures; single-event transient stimulus; stimulus temporal profile; Circuit topology; Filtering; Frequency domain analysis; Frequency response; Linear circuits; Operational amplifiers; Pulse shaping methods; Space vector pulse width modulation; Transient analysis; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2002.805330
Filename
1134273
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