• DocumentCode
    950056
  • Title

    Frequency domain analysis of analog single-event transients in linear circuits

  • Author

    Boulghassoul, Y. ; Massengill, L.W. ; Turflinger, T.L. ; Holman, W.T.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
  • Volume
    49
  • Issue
    6
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    3142
  • Lastpage
    3147
  • Abstract
    Using frequency-domain analysis techniques, a study of the relationship between the frequency spectrum of a single-event transient (SET) stimulus and the frequency response of internal circuit blocks of typical operational amplifier architectures has been performed. Results explain several general analog SET (ASET) observations, including the relative importance of the stimulus temporal profile, the circuit bandwidth, and the ion strike location relative to major circuit modules. Benefits gained from frequency compensation are evident, as important filtering of high-frequency signal components occur, reducing detrimental effects on the operation of the circuit.
  • Keywords
    SPICE; bipolar analogue integrated circuits; circuit simulation; fast Fourier transforms; frequency response; frequency-domain analysis; ion beam effects; operational amplifiers; transient analysis; LM124 operational amplifier; Silvaco SPICE circuit simulator; analog single-event transients; circuit bandwidth; fast Fourier transform; frequency compensation; frequency domain analysis; frequency response; frequency spectrum; high-frequency signal component filtering; ion strike location; linear circuits; operational amplifier architectures; single-event transient stimulus; stimulus temporal profile; Circuit topology; Filtering; Frequency domain analysis; Frequency response; Linear circuits; Operational amplifiers; Pulse shaping methods; Space vector pulse width modulation; Transient analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2002.805330
  • Filename
    1134273