Title :
Validation of an SEU simulation technique for a complex processor: PowerPC7400
Author :
Rezgui, Sana ; Swift, Gary M. ; Velazco, Raoul ; Farmanesh, Farhad F.
Author_Institution :
TIMA Lab., Grenoble, France
fDate :
12/1/2002 12:00:00 AM
Abstract :
Results from fault injection experiments on a modern complex processor, the PPC7400, are combined with static register ground testing to predict single-event upset rates of several benchmark application programs. These results compare favorably with in-beam measurements on the same programs.
Keywords :
fault diagnosis; integrated circuit testing; ion beam effects; microprocessor chips; space vehicle electronics; PowerPC7400 microprocessors; SEU simulation technique; benchmark application programs; code emulating upset injection method; complex processor; error-rate prediction methodology; extraterrestrial radiation effects; fault injection experiments; heavy-ion testing; ion radiation effects; processor errors; single-event upset rates; static register ground testing; Benchmark testing; Circuit faults; Circuit testing; Integrated circuit testing; Laboratories; Microprocessors; Radiation effects; Registers; Semiconductor device testing; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.805982
