Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

Author

Pease, Ronald L. ; Sternberg, Andrew L. ; Boulghassoul, Younes ; Massengill, Lloyd W. ; Buchner, Stephen ; McMorrow, Dale ; Walsh, Dave S. ; Hash, Gerald L. ; LaLumondiere, Stephen D. ; Moss, Steven C.

Author_Institution

RLP Res. Inc., Albuquerque, NM, USA

Volume

49

Issue

6

fYear

2002

fDate

12/1/2002 12:00:00 AM

Firstpage

3163

Lastpage

3170

Abstract

Generally good agreement is obtained between the single-event output voltage transient waveforms obtained by exposing individual circuit elements of a bipolar comparator and operational amplifier to an ion microbeam, a pulsed laser beam, and circuit simulations using SPICE. The agreement is achieved by adjusting the amounts of charge deposited by the laser or injected in the SPICE simulations. The implications for radiation hardness assurance are discussed.

Keywords

SPICE; bipolar analogue integrated circuits; circuit simulation; comparators (circuits); ion beam effects; laser beam effects; operational amplifiers; transients; SETs; SPICE; bipolar linear circuits; circuit elements; circuit simulation; comparator; ion microbeam; laser light; operational amplifier; radiation hardness assurance; single-event output voltage transient waveforms; Circuit simulation; Laser beams; Linear circuits; Operational amplifiers; Optical pulses; Pulse amplifiers; Pulse circuits; Pulsed laser deposition; SPICE; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.805346

Filename

1134276