• DocumentCode
    950701
  • Title

    Increase of inverse beta of Si transistors due to low-temperature treatments

  • Author

    Aceves, Mariano ; don Kendall, L.

  • Author_Institution
    Instituto National de Astrofisica, Optica y Electronica, Puebla, Mexico
  • Volume
    15
  • Issue
    10
  • fYear
    1979
  • Firstpage
    282
  • Lastpage
    283
  • Abstract
    Transistors having diffused phosphorus emitters were treated at temperatures of 750° and 1100°C, At 1100°C, the direct and inverse beta both increase approximately as the square root of time. At 750°C, the inverse beta improves much more rapidly than the direct beta, and this is attributed primarily to a reduction of the concentration gradient in the base. This will decrease the inverse base transit time and allow i.i.l. transistors to operate at higher frequencies.
  • Keywords
    bipolar transistors; integrated circuit technology; I2L transistors; bipolar transistors; diffused P emitters; high frequency operation; inverse base transit time decrease; inverse beta increase; low temperature heat treatment; reduced base concentration gradient; treatment at 750 degree C;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19790201
  • Filename
    4243226