Title :
Increase of inverse beta of Si transistors due to low-temperature treatments
Author :
Aceves, Mariano ; don Kendall, L.
Author_Institution :
Instituto National de Astrofisica, Optica y Electronica, Puebla, Mexico
Abstract :
Transistors having diffused phosphorus emitters were treated at temperatures of 750° and 1100°C, At 1100°C, the direct and inverse beta both increase approximately as the square root of time. At 750°C, the inverse beta improves much more rapidly than the direct beta, and this is attributed primarily to a reduction of the concentration gradient in the base. This will decrease the inverse base transit time and allow i.i.l. transistors to operate at higher frequencies.
Keywords :
bipolar transistors; integrated circuit technology; I2L transistors; bipolar transistors; diffused P emitters; high frequency operation; inverse base transit time decrease; inverse beta increase; low temperature heat treatment; reduced base concentration gradient; treatment at 750 degree C;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790201