Title :
Chip Alignment Templates for Multichip Module Assembly
Author :
Tewksbury, S.K. ; Lindstrom, T.L. ; Hornak, L.A. ; Biazzo, M.R. ; Bosworth, R.H.
Author_Institution :
AT and T Bell Laboratories,NJ
fDate :
3/1/1987 12:00:00 AM
Abstract :
Future high-performance large-scale digital systems will increasingly require high-density multichip hybrid packaging techniques. Chip attachment by flip-chip mounting, as in the well-established eontrolled-collapse solder-bump contact approach, has several fundamental advantages over the more familiar wire-bonded hybrid assembly approach. However, testing of flip-chip mounted assemblies and replacement of defective parts, along with the alignment of chip bonding pads to substrate pads, involves substantial practical difficulties. A chip alignment template, aligned to and permanently mounted on the hybrid substrate, is proposed. Anisotropic etching of silicon wafers provides a high-precision technique compatible with batch fabrication of the templates. Fabrication of such templates and factors influencing chip alignment accuracy are discussed.
Keywords :
Assembly systems; Hybrid integrated circuit packaging; Integrated circuit packaging; Surface mounting; Anisotropic magnetoresistance; Assembly; Digital systems; Etching; Fabrication; Large-scale systems; Multichip modules; Packaging; Testing; Wafer bonding;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1987.1134701