Title :
Computational study of band-crossing reactions
Author :
Matta, Alain ; Knio, Omar M. ; Ghanem, Roger G. ; Chen, Chua-Hua ; Santiago, Juan G. ; Debusschere, Bert ; Najm, Habib N.
Author_Institution :
Dept. of Mech. Eng., Johns Hopkins Univ. Baltimore, MD, USA
fDate :
4/1/2004 12:00:00 AM
Abstract :
A numerical study of band-crossing reactions is conducted using a quasi-one-dimensional (1-D) computational model that accounts for species bulk advection, electromigration velocities, diffusion, and chemical reaction. The model is used to simulate chemical reactions between two initially distinct sample zones, referred to as "bands," that cross each other due to differences in electromigration velocities. The reaction is described in terms of a single step, reversible mechanism involving two reactants and one product. A parametric study is first conducted of the behavior of the species profiles, and results are interpreted in terms of the Damköhler number and of the ratios of the electromigration velocities of the reactant and product. Computed results are then used to explore the possibility of extracting forward and backward reaction rates based on time resolved observation of integral moments of species concentrations. In particular, it is shown that in the case of fast reactions, robust estimates can be obtained for high forward rates, but that small reverse rates may not be accurately observed.
Keywords :
band theory; chemical reactions; electromigration; estimation theory; microfluidics; numerical analysis; DamkOhler number; backward reaction rates; band-crossing reactions; chemical reaction; computational study; diffusion reaction; distinct sample zones; electromigration velocities; fast reactions; forward reaction rates; integral moments; numerical study; parametric study; quasi 1-D computational model; reversible mechanism; robust estimates; species bulk advection; species concentrations; time resolved observation; Biochemical analysis; Biochemistry; Chemicals; Computational modeling; Electrokinetics; Electromigration; Kinetic theory; Microfluidics; Parametric study; Robustness;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2004.825315