DocumentCode
951177
Title
On the semiconductor laser logarithmic gain-current density relation
Author
DeTemple, T.A. ; Herzinger, Craig M.
Author_Institution
Illinois Univ., Urbana, IL, USA
Volume
29
Issue
5
fYear
1993
fDate
5/1/1993 12:00:00 AM
Firstpage
1246
Lastpage
1252
Abstract
The simplified relation, α=G 0 In (η iJ /J 0), between material gain α and current density J is shown to be a very good shape approximation, for quantum wells and bulk materials, essentially independent of the type of recombination processes present. Simulations show that for a given material system, G 0 decreases by only about 30% from pure electron-hole-recombination-dominated to pure Auger-recombination-dominated. A generic quantum-well situation is explored to reveal the density of states and recombination coefficient dependence of G 0 and to formulate simple estimates for G 0. The results were tested against published data for eight quantum-well diode lasers. The predicted values of G 0 were generally found to be in agreement with experiments only for the wider gap diodes. The discrepancies were attributed in part to carrier induced absorption, and it is shown that the formalism can be modified in selected cases to incorporate this without changing the basic form of the gain. A new expression which relates the temperature dependence of the measured parameters to the characteristic temperature, T 0, is provided
Keywords
electron-hole recombination; laser theory; semiconductor lasers; Auger-recombination-dominated; bulk materials; carrier induced absorption; characteristic temperature; current density; density of states; electron-hole-recombination-dominated; logarithmic gain-current density relation; material gain; quantum wells; quantum-well diode lasers; recombination coefficient; recombination processes; semiconductor laser; shape approximation; temperature dependence; Current density; Optical materials; Quantum wells; Radiative recombination; Semiconductor lasers; Semiconductor materials; Shape; Spontaneous emission; Temperature dependence; Time of arrival estimation;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.236138
Filename
236138
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