• DocumentCode
    951185
  • Title

    Nondestructive refractive-index profile measurement of elliptical optical fibre or preform

  • Author

    Chu, P.L.

  • Author_Institution
    University of New South Wales, School of Electrical Engineering, Kensington, Australia
  • Volume
    15
  • Issue
    12
  • fYear
    1979
  • Firstpage
    357
  • Lastpage
    358
  • Abstract
    A nondestructive method of determining the refractive-index profile of an elliptic optical fibre or preform is reported. For the fibre, the pathlength data obtained from interference microscopic measurement are used. For the preform, the ray exit angles are used. These data are put into an integral that can be inverted numerically to obtain the reconstructed profile.
  • Keywords
    optical fibres; refractive index measurement; elliptical optical fibre; elliptical optical fibre preforms; interference microscopic measurement; nondestructive method; ray exit angles; refractive index profile measurement;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19790254
  • Filename
    4243353
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=951185