DocumentCode :
951289
Title :
Identification of band-edge optical transition types in tensile strained quantum wells
Author :
Baliga, Arvind ; Anderson, Neal G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Volume :
29
Issue :
5
fYear :
1993
fDate :
5/1/1993 12:00:00 AM
Firstpage :
1355
Lastpage :
1363
Abstract :
A new characterization technique based on photoluminescence excitation spectroscopy (PLE) which allows simple and direct identification of band-edge transition types in quantum wells is developed. A ratio curve is generated by pointwise division of one PLE spectrum by a second PLE spectrum. The two PLE spectra are obtained using orthogonal polarizations of the excitation beam, which is incident on the sample surface at an oblique angle, and the transition types near the band edge are identified by simple visual inspection of the ratio curve. The authors describe and assess the theoretical foundation for the ratio method, detail the experimental procedure, present PLE spectra and ratio curves for several quantum wells, and determine optimum experimental conditions and the physical origin of features in the ratio curve through investigation of the influence of several experimental parameters
Keywords :
deformation; luminescence of inorganic solids; photoluminescence; semiconductor quantum wells; spectroscopy; SQW; band-edge optical transition types; excitation beam; oblique angle; orthogonal polarizations; photoluminescence excitation spectroscopy; pointwise division; ratio curve; ratio method; semiconductor quantum wells; tensile strained quantum wells; visual inspection; Absorption; Inspection; Optical devices; Optical mixing; Optical modulation; Optical polarization; Optical sensors; Photoluminescence; Spectroscopy; Stimulated emission;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.236149
Filename :
236149
Link To Document :
بازگشت