DocumentCode :
951405
Title :
High Frequency Behavior of Ceramic Multilayer Capacitors
Author :
Boser, Otmar ; Newsome, Vernon
Author_Institution :
Philips Corp
Volume :
10
Issue :
3
fYear :
1987
fDate :
9/1/1987 12:00:00 AM
Firstpage :
437
Lastpage :
439
Abstract :
The impedance of ceramic capacitors, made from different dielectric materials, was measured as a function of frequency from 1 MHz to 1 GHz. Most of the capacitors were of 0805 size and either end terminated or side terminated. The capacitance values ranged from a minimum of 50 pF to 100 nF. The high-frequency impedance measurements demonstrate that the inductance is a factor of two larger in end-terminated than in side-terminated ceramic muitilayer capacitors of size 0805. The inductance measured by two independent methods is 0.7 nH for the side-terminated 0805 capacitors. The inductance is only dependent on the geometry of the capacitor and independent of the dielectric material used. The capacitance and, in turn, the dielectric constant, remains constant for Z5U and X7R materials up to 100 MHz. For NPO materials the dielectric constant remains constant up to 1 GHz.
Keywords :
Ceramic capacitors; Capacitance; Capacitors; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Impedance measurement; Inductance measurement; Nonhomogeneous media;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1987.1134747
Filename :
1134747
Link To Document :
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