DocumentCode
951601
Title
Closely Packed Microstrip Lines as Very High Speed Chip-to-Chip Interconnects
Author
Kwon, Oh-Kyong ; Pease, R.Fabian W.
Author_Institution
Stan ford University,Stanford,CA
Volume
10
Issue
3
fYear
1987
fDate
9/1/1987 12:00:00 AM
Firstpage
314
Lastpage
320
Abstract
As the density, complexity, and speed of VLSI circuits continue to increase, it has become apparent that the chip-to-chip interconnections can limit overall performance of an integrated system. Here the analysis is discussed of interconnections as long transmission lines whose cross-sectional dimensions are the order of several micrometers. The relevant parameters are signal delay, loss, crosstalk, and spatial density. The time domain response of coupled microscopic transmission lines is also shown. Preliminary results indicate that conventional quasi-TEM analysis is inadequate but that modification can bring about substantial improvement. A proposed two-level structure appears to offer an attractive combination of high-speed (c/1.8), low crosstalk (less than ten percent over 10 cm), low loss (0.05 dB/mm at 1 GHz), and high density (35/µm period) and can operate at frequencies exceeding 1 GHz.
Keywords
Integrated circuit interconnections; Interconnections, Integrated circuits; Microstrip; Couplings; Crosstalk; Delay; Distributed parameter circuits; Frequency; Integrated circuit interconnections; Microscopy; Microstrip; Transmission lines; Very large scale integration;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1987.1134766
Filename
1134766
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