Title :
Domain growth in thin MnBi films
Author :
Dekker, P. ; van den Berg, H.A.M.
Author_Institution :
Delft University of Technology, Delft, The Netherlands
fDate :
9/1/1974 12:00:00 AM
Abstract :
The influence of the coercive force, Hc, on domain growth in MnBi films is investigated on a local scale. It is found that for domain tip movement to occur, a critical domain width has to be exceeded. When Hcis in the same order of magnitude of the magnetostatic pressures, this critical width is restored in the final stripe domain width, which is considerably greater than the equilibrium domain width in the absence of Hc.
Keywords :
Coercive forces; Magnetic domains; Magnetization reversal; Manganese bismuth films; Amorphous magnetic materials; Coercive force; Garnet films; Hysteresis; Magnetic domains; Magnetic field measurement; Magnetization reversal; Microscopy; Perpendicular magnetic recording; Saturation magnetization;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1974.1058365