• DocumentCode
    951696
  • Title

    Quality test of semiconductor memories by jitter measurement

  • Author

    R¿?der, Horst

  • Author_Institution
    Technische Hochschule Darmstadt, Institut fÿr Ã\x9cbertragungstechnik Abteilung Elektronische Schaltungen, Darmstadt, West Germany
  • Volume
    15
  • Issue
    14
  • fYear
    1979
  • Firstpage
    428
  • Lastpage
    429
  • Abstract
    This letter states the results form the application of a jitter measuring method suited to the quality testing of electronic semiconductor memories. A description is given of a jitter measuring apparatus which enables detection of latent defects in semiconductor memories.
  • Keywords
    field effect integrated circuits; integrated circuit testing; integrated memory circuits; logic testing; quality control; read-only storage; EPROM; MOS; faulty bonding; jitter measurement; latent defects; leakage current paths; measuring apparatus; moisture effect; quality testing; semiconductor memories; surface contamination;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19790307
  • Filename
    4243417
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=951696