DocumentCode
951700
Title
1/f Noise Measurement in Semicontinuous Metal Films
Author
Takagi, Keiji ; Mizunami, Toru ; Masuda, Satoshi
Author_Institution
Kyushu Institute of Technology, Sensuicho, Japan
Volume
10
Issue
4
fYear
1987
fDate
12/1/1987 12:00:00 AM
Firstpage
687
Lastpage
689
Abstract
The noise of gold and aluminum films was measured. All noise spectra are the 1/f type. The noise of the gold films increases in proportion to the fifth power of the resistance in the high resistance range and to the cube of the resistance in the low resistance range. The noise of thin films is qualitatively characterized. The resistance dependences were explained by a static-contact model and granular-resistor model, respec- tively.
Keywords
Aluminum materials/devices; Gold materials/devices; Thin-film circuit noise; Aluminum; Current measurement; Electrical resistance measurement; Gold; Noise generators; Noise level; Noise measurement; Noise shaping; Temperature dependence; Transistors;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1987.1134775
Filename
1134775
Link To Document