DocumentCode
951882
Title
Open-circuit to short-circuit switching: method for lifetime measurement in solar cells
Author
Dhariwal, S.R. ; Basu, Niranjan ; Gadre, Ranjana
Author_Institution
Government College, Department of Physics, Ajmer, India
Volume
15
Issue
15
fYear
1979
Firstpage
456
Lastpage
458
Abstract
A new method is suggested for measurement of lifetime of photoinjected carriers in the base layer of a p-n junction solar cell. The cell is switched from the open-circuit to the shortcircuit mode of operation by using a negative voltage pulse. C.R.O. trace of the output voltage pulse provides a direct means for lifetime measurement.
Keywords
carrier lifetime; minority carriers; solar cells; lifetime measurement method; lifetime of photoinjected carriers; minority carriers; open circuit to short circuit switching; p-n junction solar cell;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19790328
Filename
4243441
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