DocumentCode :
951919
Title :
Measurement of the Characteristics of High-Q Ceramic Capacitors
Author :
Ingalls, Mark ; Kent, Gordon
Author_Institution :
Dielectric Lab.,NY
Volume :
10
Issue :
4
fYear :
1987
fDate :
12/1/1987 12:00:00 AM
Firstpage :
487
Lastpage :
495
Abstract :
The quality factor, equivalent series resistance, and the · frequency of self-resonance are parts of the specifications of high-Q ceramic capacitors. These quantities are obtained from measurements on transmission lines with the capacitor in series or shunt. Part A: Resonant structures designed to extend the Electronics Industries Association (EIA) standard RS-483 downwards below 10 MHz and upwards above 3 GHz are discussed. For the low-frequency lines, a rule for extrapolating Q values outside the range of data is proposed. The rule is based on the frequency-dependence of the input/output coupling. The high-frequency line incorporates a method of tuning which eliminates the need for interpolation or extrapolation. It is particularly suited to measuring small parallel-plate capacitors which can be mounted on a flat shorting plate. Part B: It is shown that the first self-resonance, when viewed in terms of a series R, L, C equivalent circuit, is a poorly defined quantity. It is not always observable; it may not exist; and it may be of minor importance to design applications, it is proposed that the resonance specification of capacitors should be the first parallel resonance, defined as the first maximum in dissipation loss.
Keywords :
Ceramic capacitors; Q measurement; Resonance; Capacitors; Ceramics; Circuit optimization; Electrical resistance measurement; Electronics industry; Frequency; Q factor; Resonance; Transmission line measurements; Tuning;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1987.1134797
Filename :
1134797
Link To Document :
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