• DocumentCode
    952526
  • Title

    Foreword

  • Author

    Keys, L.

  • Author_Institution
    Guest Editor
  • Volume
    10
  • Issue
    3
  • fYear
    1974
  • fDate
    9/1/1974 12:00:00 AM
  • Firstpage
    151
  • Lastpage
    151
  • Keywords
    Electronic components; Electronics industry; Electronics packaging; Failure analysis; Integrated circuit interconnections; Radiation detector circuits; Radiation detectors; Stress; Thick film circuits; Transactions Committee;
  • fLanguage
    English
  • Journal_Title
    Parts, Hybrids, and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0361-1000
  • Type

    jour

  • DOI
    10.1109/TPHP.1974.1134858
  • Filename
    1134858