DocumentCode :
952642
Title :
3-D capacitance extraction of IC interconnects using field solvers and homogenization technique
Author :
Ren, Z. ; Lage, C.
Author_Institution :
Cadence Design Syst. Inc., San Jose, CA, USA
Volume :
40
Issue :
2
fYear :
2004
fDate :
3/1/2004 12:00:00 AM
Firstpage :
703
Lastpage :
706
Abstract :
In the extraction and simulation of integrated circuit (IC) chips using electromagnetic field solvers, one of the difficulties is the modeling of the multilayered dielectric structures. The consideration of these thin layers in the field solvers dramatically increases the memory and the computation time. This paper presents a numerical homogenization strategy of multilayered dielectric media that allows removing the dielectric layers from the field solver models. A technique that transforms the homogenized anisotropic materials to isotropic ones is also developed. The homogenization strategy has been applied in both the finite-element method and a fast multipole expansion accelerated boundary-element method. The validation is accomplished through examples of capacitance extraction on a real digital IC chip.
Keywords :
boundary-elements methods; capacitance measurement; electromagnetic fields; finite element analysis; integrated circuit interconnections; integrated circuit modelling; magnetic multilayers; 3-D capacitance extraction; IC interconnects; VLSI circuit parameter extraction; boundary-element method; dielectric layers; electromagnetic field solvers; finite-element method; homogenization technique; homogenized anisotropic materials; integrated circuit chips; isotropic ones; multilayered dielectric structures; multipole expansion; thin layers; Acceleration; Anisotropic magnetoresistance; Capacitance; Computational modeling; Dielectrics; Electromagnetic fields; Electromagnetic modeling; Finite element methods; Integrated circuit interconnections; Integrated circuit modeling;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2004.825422
Filename :
1284511
Link To Document :
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