DocumentCode :
952702
Title :
A Survey of Conducton Mechanisms in Very Thin Films
Author :
Bashara, N.M.
Author_Institution :
Univ. of Nebraska, Lincoln, NE
Volume :
11
Issue :
1
fYear :
1964
fDate :
3/1/1964 12:00:00 AM
Firstpage :
4
Lastpage :
9
Abstract :
This survey deals with conduction mechanisms in thin films, both metals and dielectrics, in the thickness range between 10-6and 10-5cm and generally under 2-3 x 10-6cm. Conduction in metals with an island structure is discussed in terms of a thermally-activated process based on a model suggested by Frenkel. The model makes it possible to interpret the behavior qualitatively. Dielectrics exhibit a tunneling-like behavior and/or a Schottky-like behavior depending on thickness and temperature. Anomolous effects such as the negative resistance sandwich structure and gap structures with low work functions are also discussed.
Keywords :
Conductive films; Current density; Dielectric constant; Dielectric thin films; Electrons; Kelvin; Sandwich structures; Temperature; Thin film devices; Transistors;
fLanguage :
English
Journal_Title :
Component Parts, IEEE Transactions on
Publisher :
ieee
ISSN :
0097-6601
Type :
jour
DOI :
10.1109/TCP.1964.1134966
Filename :
1134966
Link To Document :
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