Title :
Integrated-circuit fabrication flaw detected using the supply-current analysis technique
Author_Institution :
Post Office Research Department, Ipswich, UK
Abstract :
A serious internal fabrication defect detected in a t.t.l. bipolar integrated circuit has been revealed by analysing anomalies in the supply-current dependence upon the logic input. The result strengthens the claim for using this approach as a quality and reliability screening method.
Keywords :
integrated circuit testing; integrated logic circuits; production testing; quality control; reliability; transistor-transistor logic; IC fabrication flaw detection; IC testing; production testing; quality control screening TTL; reliability screening method; supply current analysis technique;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19790533
