Title :
Fabrication and Reliability of Thin Film Crossovers and Terminations
Author :
Lessor, A.E., Jr.
Author_Institution :
IBM Corp., Owego, NY
fDate :
6/1/1964 12:00:00 AM
Keywords :
Conducting materials; Conductive films; Conductors; Fabrication; Geometry; Impedance; Insulation; Shadow mapping; Thin film circuits; Transistors;
Journal_Title :
Component Parts, IEEE Transactions on
DOI :
10.1109/TCP.1964.1134998
