DocumentCode :
953119
Title :
The Glaze Resistor - It´s Structure and Reliability
Author :
Melan, E.H. ; Mones, A.H.
Author_Institution :
International Business Machines Corporation, Poughkeepsie, NY
Volume :
11
Issue :
2
fYear :
1964
fDate :
6/1/1964 12:00:00 AM
Firstpage :
76
Lastpage :
85
Abstract :
Described herein are certain features of the microstructure of the palladium-silver-glass glaze resistor. Experimental evidence given indicates PdO to be a controlling factor in the conduction process. The effect of process variables on resistivity, TCR, and drift behavior under environmental stress are also discussed
Keywords :
Conductivity; Firing; Glass; Glazes; Microstructure; Palladium; Resistors; Silver; Stability; Temperature;
fLanguage :
English
Journal_Title :
Component Parts, IEEE Transactions on
Publisher :
ieee
ISSN :
0097-6601
Type :
jour
DOI :
10.1109/TCP.1964.1135004
Filename :
1135004
Link To Document :
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