Title :
The Plasma Oxidation of Metals in Forming Electronic Circuit Components
Author :
Johnson, Morris C.
Author_Institution :
Burroughs Corp., Paoli, PA
fDate :
6/1/1964 12:00:00 AM
Abstract :
This study involves the fabrication of tantalum-pentoxide capacitors by other than the conventional thermal or aqueous electrolytic techniques. A new method of dielectric formation is described, and some of the results of the measurements performed on the passive devices are presented. This plasma-anodic process is then compared to the aqueous anodic processes, with the emphasis upon the compatibility of dry anodization techniques to vacuum techniques for the deposition of metallic thin films.
Keywords :
Capacitors; Dielectric devices; Dielectric measurements; Dielectric thin films; Electronic circuits; Fabrication; Oxidation; Performance evaluation; Plasma devices; Plasma measurements;
Journal_Title :
Component Parts, IEEE Transactions on
DOI :
10.1109/TCP.1964.1135012