• DocumentCode
    953194
  • Title

    The Plasma Oxidation of Metals in Forming Electronic Circuit Components

  • Author

    Johnson, Morris C.

  • Author_Institution
    Burroughs Corp., Paoli, PA
  • Volume
    11
  • Issue
    2
  • fYear
    1964
  • fDate
    6/1/1964 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This study involves the fabrication of tantalum-pentoxide capacitors by other than the conventional thermal or aqueous electrolytic techniques. A new method of dielectric formation is described, and some of the results of the measurements performed on the passive devices are presented. This plasma-anodic process is then compared to the aqueous anodic processes, with the emphasis upon the compatibility of dry anodization techniques to vacuum techniques for the deposition of metallic thin films.
  • Keywords
    Capacitors; Dielectric devices; Dielectric measurements; Dielectric thin films; Electronic circuits; Fabrication; Oxidation; Performance evaluation; Plasma devices; Plasma measurements;
  • fLanguage
    English
  • Journal_Title
    Component Parts, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0097-6601
  • Type

    jour

  • DOI
    10.1109/TCP.1964.1135012
  • Filename
    1135012