DocumentCode :
953282
Title :
Low-power logic circuit and SRAM cell applications with silicon on depletion Layer CMOS (SODEL CMOS) technology
Author :
Inaba, Satoshi ; Nagano, Hajime ; Miyano, Kiyotaka ; Mizushima, Ichiro ; Okayama, Yasunori ; Nakauchi, Takahiro ; Ishimaru, Kazunari ; Ishiuchi, Hidemi
Author_Institution :
Process & Manuf. Eng. Center, Toshiba Corp. Semicond. Co., Yokohama, Japan
Volume :
41
Issue :
6
fYear :
2006
fDate :
6/1/2006 12:00:00 AM
Firstpage :
1455
Lastpage :
1462
Abstract :
In this paper, the switching performance of Silicon on Depletion Layer CMOS (SODEL CMOS) is investigated with a view to realizing high-speed and low-power CMOS applications. Thanks to smaller parasitic capacitance, the propagation delay time (τpd) in SODEL CMOS has been improved by up to 25% compared to that of conventional bulk CMOS in five stacked nFET inverters at the same Vdd. It is also confirmed that about 30% better power-delay product can be realized at the same τpd with reduced Vdd in SODEL CMOS. In SRAM cell applications, SODEL CMOS shows high Static Noise Margin (SNM) of ∼95 mV at Vdd=0.6 V. Smaller bitline delay is expected and confirmed in SODEL CMOS SRAM by SPICE simulations. Latch-up immunity for α-particle irradiation in SODEL CMOS was also found to be comparable to that of conventional bulk CMOS. Therefore, SODEL CMOS device and circuit technology is expected to provide a better solution for low-power system-on-a-chip (SoC).
Keywords :
CMOS logic circuits; SPICE; SRAM chips; capacitance; delays; logic circuits; low-power electronics; system-on-chip; 0.6 V; SODEL CMOS technology; SPICE simulations; SRAM cell applications; low-power logic circuit; low-power system-on-a-chip; parasitic capacitance; propagation delay time; silicon on depletion layer CMOS; static noise margin; switching performance; CMOS logic circuits; CMOS technology; Inverters; Logic circuits; Parasitic capacitance; Propagation delay; Random access memory; SPICE; Silicon; System-on-a-chip; Body effect; CMOS digital integrated circuits; MOS devices; SPICE; SRAM chips; epitaxial growth; logic circuits; semiconductor junctions; silicon on insulator technology;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2006.874335
Filename :
1637609
Link To Document :
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