• DocumentCode
    953282
  • Title

    Low-power logic circuit and SRAM cell applications with silicon on depletion Layer CMOS (SODEL CMOS) technology

  • Author

    Inaba, Satoshi ; Nagano, Hajime ; Miyano, Kiyotaka ; Mizushima, Ichiro ; Okayama, Yasunori ; Nakauchi, Takahiro ; Ishimaru, Kazunari ; Ishiuchi, Hidemi

  • Author_Institution
    Process & Manuf. Eng. Center, Toshiba Corp. Semicond. Co., Yokohama, Japan
  • Volume
    41
  • Issue
    6
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    1455
  • Lastpage
    1462
  • Abstract
    In this paper, the switching performance of Silicon on Depletion Layer CMOS (SODEL CMOS) is investigated with a view to realizing high-speed and low-power CMOS applications. Thanks to smaller parasitic capacitance, the propagation delay time (τpd) in SODEL CMOS has been improved by up to 25% compared to that of conventional bulk CMOS in five stacked nFET inverters at the same Vdd. It is also confirmed that about 30% better power-delay product can be realized at the same τpd with reduced Vdd in SODEL CMOS. In SRAM cell applications, SODEL CMOS shows high Static Noise Margin (SNM) of ∼95 mV at Vdd=0.6 V. Smaller bitline delay is expected and confirmed in SODEL CMOS SRAM by SPICE simulations. Latch-up immunity for α-particle irradiation in SODEL CMOS was also found to be comparable to that of conventional bulk CMOS. Therefore, SODEL CMOS device and circuit technology is expected to provide a better solution for low-power system-on-a-chip (SoC).
  • Keywords
    CMOS logic circuits; SPICE; SRAM chips; capacitance; delays; logic circuits; low-power electronics; system-on-chip; 0.6 V; SODEL CMOS technology; SPICE simulations; SRAM cell applications; low-power logic circuit; low-power system-on-a-chip; parasitic capacitance; propagation delay time; silicon on depletion layer CMOS; static noise margin; switching performance; CMOS logic circuits; CMOS technology; Inverters; Logic circuits; Parasitic capacitance; Propagation delay; Random access memory; SPICE; Silicon; System-on-a-chip; Body effect; CMOS digital integrated circuits; MOS devices; SPICE; SRAM chips; epitaxial growth; logic circuits; semiconductor junctions; silicon on insulator technology;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.874335
  • Filename
    1637609