DocumentCode
953414
Title
Responsivity and noise characterisation of ge avalanche photodiode throughout wavelength range 1.1¿1.7 ¿m
Author
Brain, M.C.
Author_Institution
Post Office Research Centre, Ipswich, UK
Volume
15
Issue
25
fYear
1979
Firstpage
821
Lastpage
823
Abstract
Mixed carrier injection in a commercial n+-p germaniun a.p.d. causes the excess multiplication noise to be wavelength dependent, with averaged k-values of around unity. The quantum efficiency is 70% between 1.1 and 1.5 ¿m, and the unmultiplied bulk leakage current density is estimated to be 3.5Ã10¿4 A cm¿2
Keywords
avalanche photodiodes; optical communication equipment; Ge avalanche photodiode; excess multiplication noise; leakage noise; mixed carrier injection digital optical communication equipment; quantum efficiency; responsivity; unmultiplied bulk leakage current density;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19790584
Filename
4243767
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