Title :
Dynamic crosstie nucleation thresholds for crosstie memory
Author_Institution :
U.S. Naval Ordnance Laboratory, Silver Spring, Md.
fDate :
1/1/1975 12:00:00 AM
Abstract :
Pulsed magnetic fields (widths of 1 to 550 ns) with amplitudes above a threshold value will generate crossties [1] in Permalloy films (∼300 to 500 Å). Pulse width and film thickness affect the threshold values, which decrease with increasing pulse width and increasing film thickness. Fig. 2 shows typical behavior.
Keywords :
Magnetic measurements; Permalloy memories; Conductive films; Dielectric thin films; Glass; Magnetic field measurement; Magnetic fields; Magnetic films; Microstrip; Pulse generation; Space vector pulse width modulation; Substrates;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1975.1058544
