DocumentCode
953613
Title
Design Implications of Prow Formation During Electrical Contact Closure
Author
Cuthrell, Robert E.
Author_Institution
Sandia Laboratories
Volume
11
Issue
2
fYear
1975
fDate
6/1/1975 12:00:00 AM
Firstpage
110
Lastpage
114
Abstract
The contact resistance behavior of electrical contacts which were closed on oxide and sulfide contaminants is reported. The minimum wipe which is required to break through contaminants and to produce ´a minimum contact resistance is approximately equivalent to the diameter of the load-bearing area. The tendency of contaminant accumulations, which are formed at the front surface of the moving contact, to break away and pass between the contacts is correlated with the extent of wipe. Some implications of these results in the design of electrical contacts to function in contaminating environments are discussed.
Keywords
Contacts; Contamination; Environmental pollution; Resistance; Bonding; Circuits; Cleaning; Contact resistance; Dielectrics and electrical insulation; Friction; Pollution measurement; Polymer films; Surface contamination; Surface resistance;
fLanguage
English
Journal_Title
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0361-1000
Type
jour
DOI
10.1109/TPHP.1975.1135053
Filename
1135053
Link To Document