• DocumentCode
    953613
  • Title

    Design Implications of Prow Formation During Electrical Contact Closure

  • Author

    Cuthrell, Robert E.

  • Author_Institution
    Sandia Laboratories
  • Volume
    11
  • Issue
    2
  • fYear
    1975
  • fDate
    6/1/1975 12:00:00 AM
  • Firstpage
    110
  • Lastpage
    114
  • Abstract
    The contact resistance behavior of electrical contacts which were closed on oxide and sulfide contaminants is reported. The minimum wipe which is required to break through contaminants and to produce ´a minimum contact resistance is approximately equivalent to the diameter of the load-bearing area. The tendency of contaminant accumulations, which are formed at the front surface of the moving contact, to break away and pass between the contacts is correlated with the extent of wipe. Some implications of these results in the design of electrical contacts to function in contaminating environments are discussed.
  • Keywords
    Contacts; Contamination; Environmental pollution; Resistance; Bonding; Circuits; Cleaning; Contact resistance; Dielectrics and electrical insulation; Friction; Pollution measurement; Polymer films; Surface contamination; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Parts, Hybrids, and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0361-1000
  • Type

    jour

  • DOI
    10.1109/TPHP.1975.1135053
  • Filename
    1135053